I/O I/O � � I I O I I I I O O O I I O I O O O I I I O O O O I � � � I I � I � I O O O � O O O O O I I � � Data bus input/output with SRAM +5V power supply Ground Test pin (Connected to VDD) VCXO input (18.432MHz) VCXO output (18.432MHz) Test pin (Connected to Ground) Test pin (Connected to Ground) Test pin (Connected to Ground) Test pin (Connected to Ground) Test pin (Open) Test pin (Open) Output of internal phase comparator (3 state) Test pin (Connected to Ground) PDO output control input �L� : output ON Mute signal output �H� : mute Test pin (Connected to Ground) Test pin (Open) Test pin (Open)
Description
Digital-out signal output (Serial data stream output) Dgital external input Through out to DAOUT when DASEL is �H� (Not used)
Digital-out selection input (Not used) Test pin (Connected to Ground) C2 error correction state display Outputs if corrected properly (Not used) C2 error correction state display Outputs number of errors at C2 (Not used) C2 error correction state display Outputs whether error is present at C1 (Not used) C2 error correction state display Outputs number of errors at C1 (Not used) Muting input �H� mute +5V power supply Ground +5V power supply (Analog) Comparator input (+) (QPSK input) Comparator input (�) Ground (Analog) Test pin (Connected to ground) +5V power supply Test pin (Connected to ground) Comparate output Comparate inverted output 9.216MHz output (Open) Ground Test pin (Connected to ground) Test pin (Connected to ground) Test pin (Connected to ground) Test pin (Connected to ground) Test pin (Connected to ground) Test pin (Open) Test pin (Open) Ground (Analog) +5V power supply (Analog)
